Signals and Noise in Physics Measurements Step by Step
A lightweight execution-visualization book.
Samples as Ledgers
Four Samples Have a Checked Average
Baseline Subtraction Moves the Ledger
One Spike Changes the Range, Not the Count
Bins, Aliases, and What Sampling Cannot Know
DC Bin Adds All Samples
Alternating Bin Finds the Flip Pattern
Two Patterns Can Share the Same Samples
Averaging and Acceptance Gates
Four Readings Average to the Center
Averaging Rejects a Drifting Run
Paired Average Keeps the Difference
Lock-In Correlation and Final Audit
Matching Reference Adds the Products
Wrong Reference Cancels the Products
Measurement Signal Audit Cites Every Source
Relation Cross-Scans
Sample Mean-Range Cross-Scan
Averaging Gate Budget Cross-Scan
Finite Bin Basis Cross-Scan
Lock-In Length-Reference Cross-Scan
Boundary Depth Scans
Baseline Offset Average Three-Row Scan
Single-Spike Spread Three-Row Scan
Averaging Gate Limit Three-Row Scan
Lock-In Correlation Sign Three-Row Scan
Finite Bin Role Three-Row Scan