A diffraction-aperture cross-scan varies slit width or grating spacing across rows, showing how the order angle moves through a * sin(theta) = m * lambda or d * sin(theta) = m * lambda row by row. The arithmetic is exact only for the stated wavelengths, spacings, orders, and rows in the ideal single-aperture or grating model. Real observations add alignment, aperture geometry, coherence/bandwidth, detector calibration, material/reflection phase assumptions, and measurement uncertainty.
The aperture-minimum formula is scanned through sine marker and aperture width using exact accepted and rejected rows. Exact arithmetic here means exact results for the stated model inputs; measured inputs still carry uncertainty and significant-figure limits.
highlighted = computed this step
Start from one accepted aperture row
A single-slit minimum is not an angle sketch by itself. The accepted row multiplies aperture width by a rational sine marker and compares the product with the wavelength.
asinθ=5m⋅52=2m
Sine sweep: three markers, same aperture
Hold the aperture width fixed. Only the middle sine marker makes the product equal one wavelength, so the neighboring rows stay visible as rejected contrast cases.
a5m5m5mλ2m2m2msinθ515253m111accepted010
Width sweep: three apertures, matched sine markers
Now keep the wavelength and order fixed while changing aperture width. Wider apertures require smaller sine markers; the inverse pair is visible across three accepted rows.
a2m5m10mλ2m2m2msinθ15251m111accepted111
Narrow and wide apertures close the same wavelength ledger
The narrow row reaches the minimum at the endpoint marker. The wide row reaches the same wavelength with a smaller sine marker. The diagram is a second representation of the width sweep.