Wave Optics: Interference and Diffraction Step by Step
A lightweight execution-visualization book.
Path Difference Decides Fringes
integer-path-difference-makes-a-bright-fringe
half-wave-path-difference-makes-a-dark-fringe
wrong-path-difference-rejects-a-bright-label
Young Fringes As A Paraxial Ledger
young-fringe-position-cites-the-path-source
second-order-young-fringe-doubles-position
wider-slit-spacing-pulls-young-fringes-inward
Slit And Grating Angle Ledgers
single-slit-minimum-binds-width-and-sine
wider-slit-needs-a-smaller-sine-marker
grating-order-can-be-accepted-or-rejected
Thin Film Phase And Source Audit
thin-film-phase-flip-makes-reflected-dark
phase-flip-bit-changes-the-bright-verdict
wave-optics-audit-cites-every-source
Relation Cross-Scans
young-fringe-relation-cross-scan
diffraction-aperture-relation-cross-scan
thin-film-path-relation-cross-scan
Deeper Grating Scans
Grating Order Three-Row Scan
Grating Spacing Three-Row Scan
Grating Wavelength Three-Row Scan
Grating Sine Marker Three-Row Scan
Source-Bound Boundary Scans
Path Difference Boundary Three-Row Scan
Young Wavelength Source Three-Row Scan
Diffraction Order Boundary Three-Row Scan
Thin-Film Phase Boundary Three-Row Scan